Double‑ended Probe, full gold‑plated, bilateral spring‑loaded plungers, no holder needed. For BGA, semiconductor and PCB high‑density testing; widely used in semiconductor, consumer electronics, PCB, new energy and medical test fixtures.
Shenzhen Address: No.7 Ailian industry Area,Wulian Community,Longgang District
Changzhou Address: Hutang Science and Technology Industrial Park,Wujin District
howard.liu@imctech.cn